Spring 2008 Test #2 Review Page

CSE2340                                               Dr. Tiernan

Topics to be covered on Test #2 with accompanying notes.  Test #2 covers material from chapters 4, 6, and 8 as covered in class.  Any overview material from chapters 5 and 7 that was covered in class may also be tested.  Material from chapters prior to 4 is expected to be known in order to be used on this test.  Test will be open book.

 

Main Topics                          Test #2 is IN CLASS Thursday, April 3

Ch. 4

      Types of standard devices (just the device “comparator” not the chip number)

      Ability to use each device in circuits

      Understanding of ALU example

Ch. 5

      General purpose of programmable logic versus custom logic

Ch. 6

      Sequential vs. combinational logic

      State diagrams and tables

      Types of latches

            timing diagrams

            excitation tables

      Difference between latch and flip-flop

      Types of flip-flops

            timing diagrams

            excitation tables

Ch. 8

        Mealy model vs. Moore model

        Ability to use circuit analysis procedure

        Ability to use circuit synthesis procedure

 

Secondary and Related Topics

      Edge triggered vs. pulse triggered

 

Test will have some or all of the following characteristics:

            multiple choice questions (not more than 10) – typically 1 to 2 points each

            short answer question

            design synthesis questions

            design analysis questions

 

 

      Questions generally have their point value listed in braces at the end/side of the question

      Every test will have at least 10 points worth of extra credit available

Test grades are assigned on a curve based on the range of actual scores on the test, i.e. the highest score on the test (for example, an 89) will be the top of the curve so all scores will be assigned the curve.  For example, a high score of 89 would give that student an A because 89/89 100 = 100.  On the same test then, a score of 68 would be curved as 68/89*100 = 76 so that student would get a C (rather than a D for the original 68).

 

The test will be hard.  I write very challenging questions that require you to think all the way through them.  A few of the questions will be memory type questions.  Most however will require lots of mental effort.  Do not get too upset about it – remember EVERYONE is suffering through the same test you are and that everyone’s grade will be curved.